Products > Space & Component Technology > Electronic Components > Engineering and Design Support > Prohibited Materials Analysis

Prohibited materials in space, may prohibit
mission success

With manufacturers moving to Restriction of Hazardous Substances (RoHs) and lead-free, it is now more important than ever to make sure you are using the right materials.

TCS Space & Component Technology conducts in-house X-ray fluorescence (XRF) analysis to ensure all high-reliability space components do not contain prohibited materials which reduce device life or cause latent failures, intermittent failures, or total system failure.

X-ray Fluorescence Imaging and XRF
Owing to their high sensitivity and non-destructive nature, synchrotron radiation X-ray fluorescence (XRF) microtomography and confocal XRF imaging are among the emerging methods which are able to provide three-dimensional, quantitative information on the elemental distributions in the probed sample volume with trace-level detection limits.

Don’t let prohibited materials cause mission catastrophe.

• Lead-free (Pb-free) solders have unknown reliability, especially over the long term and an unknown risk of heat damage to EEE parts
• Pb-free platings and surface finishes have a risk of whiskers from tin-based materials
• Risk of pure tin at cold temperatures (+13°C to -40°C)
• Nondestructive identification of surface metals and underplate materials
• Pure tin analysis performed in accordance with MIL-STD-1580 requirements, JEDEC JESD213, or specific customer requirements
• Fischerscope XAN150 with silicon drift detector
• Sn97/Pb3 calibration standard acquired directly from the National Institute of Standards and Technology
• Cadmium, zinc alloy, and mecury analysis